Measuring device 'SemiScope PLIS-TEC'
Defects in expansion can also be measured! SemiScope enables spectral line analysis.
The "SemiScope PLIS-TEC" is a groundbreaking measurement device for the study of crystal defects using photoluminescence (PL). It allows for the simultaneous measurement of spectra from a selected line segment in a PL imaging image, dividing that segment into 1000 points. Additionally, by spectrally analyzing the line segment, it can accurately measure spectra even for defects that are difficult to pinpoint, such as base plane transitions. 【Features】 ■ Supports spectral line analysis ■ For the study of crystal defects ■ The excitation light density is approximately three orders of magnitude lower than that of conventional PL spectral measurements ■ Capable of measuring extended defects ■ Accurately measures spectra even for defects that are difficult to locate *For more details, please refer to the PDF document or feel free to contact us.
- Company：フォトンデザイン
- Price：Other
